MEMORY BIST

 

Dolphin Technology provides a memory test and repair (BIST) solution which enables customers to efficiently utilize all available memory compiler options. 

 

Our memory BIST is optimized for Dolphin memories, and supports all Dolphin memory compilers, including SRAM and Register File.

 

The following TSMC process nodes are supported:

 

• 16nm FF+, FFC

• 28nm HP, HPx, LP, ULP

• 40nm G, LP, ULP

• 55nm GP, LP, ULP, EF

• 65nm GP, LP

• 80nm G, GC

• 90nm G, GT, EF

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